Simulation of Hot-Electron Effects with Multi-band Semiconductor Devices
Title: | Simulation of Hot-Electron Effects with Multi-band Semiconductor Devices |
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Authors: | Tatum, Lars P., Sciullo, Madeline, Law, Mark E. |
Source: | 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2018 International Conference on. :327-330 Sep, 2018 |
Relation: | 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
Database: | IEEE Xplore Digital Library |
ISBN: | 9781538667903 |
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ISSN: | 19461577 |
DOI: | 10.1109/SISPAD.2018.8551626 |
Published in: | 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2018 International Conference on |