Simulation of Hot-Electron Effects with Multi-band Semiconductor Devices

Bibliographic Details
Title: Simulation of Hot-Electron Effects with Multi-band Semiconductor Devices
Authors: Tatum, Lars P., Sciullo, Madeline, Law, Mark E.
Source: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2018 International Conference on. :327-330 Sep, 2018
Relation: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Database: IEEE Xplore Digital Library