Characterization of the electrical and magnetic properties of sub-micron MTJ cells using scanning probe microscope interfaced with an external magnetic field generator
| Title: | Characterization of the electrical and magnetic properties of sub-micron MTJ cells using scanning probe microscope interfaced with an external magnetic field generator |
|---|---|
| Authors: | Heo, Jinhee, Kim, Deoksu, Park, SeungBae, Kim, Taewan, Chung, Ilsub |
| Source: | In Applied Surface Science 15 October 2004 237(1-4):589-595 |
| Database: | ScienceDirect |
| ISSN: | 01694332 |
|---|---|
| DOI: | 10.1016/j.apsusc.2004.06.154 |
| Published in: | Applied Surface Science |
| Language: | English |