Heo, J., Kim, D., Park, S., Kim, T., & Chung, I. (2004). Characterization of the electrical and magnetic properties of sub-micron MTJ cells using scanning probe microscope interfaced with an external magnetic field generator. Applied Surface Science, 237(1-4), 589-595. https://doi.org/10.1016/j.apsusc.2004.06.154

Heo, Jinhee, Deoksu Kim, SeungBae Park, Taewan Kim, and Ilsub Chung. "Characterization of the Electrical and Magnetic Properties of Sub-micron MTJ Cells Using Scanning Probe Microscope Interfaced with an External Magnetic Field Generator." Applied Surface Science 237, no. 1-4 (2004): 589-595. https://doi.org/10.1016/j.apsusc.2004.06.154.

Heo, Jinhee, et al. "Characterization of the Electrical and Magnetic Properties of Sub-micron MTJ Cells Using Scanning Probe Microscope Interfaced with an External Magnetic Field Generator." Applied Surface Science, vol. 237, no. 1-4, 2004, pp. 589-595, https://doi.org/10.1016/j.apsusc.2004.06.154.