Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC
| Title: | Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC |
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| Authors: | von Staudt, Hans Martin, Elnawawy, Luai Tarek, Wang, Sarah, Ping, Larry, Choi, Jung Woo |
| Source: | 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :365-371 Sep, 2022 |
| Relation: | 2022 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |
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