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Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC

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Title: Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC
Authors: von Staudt, Hans Martin, Elnawawy, Luai Tarek, Wang, Sarah, Ping, Larry, Choi, Jung Woo
Source: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :365-371 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
Database: IEEE Xplore Digital Library
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22von+Staudt%2C+Hans+Martin%22">von Staudt, Hans Martin</searchLink><br /><searchLink fieldCode="AR" term="%22Elnawawy%2C+Luai+Tarek%22">Elnawawy, Luai Tarek</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Sarah%22">Wang, Sarah</searchLink><br /><searchLink fieldCode="AR" term="%22Ping%2C+Larry%22">Ping, Larry</searchLink><br /><searchLink fieldCode="AR" term="%22Choi%2C+Jung+Woo%22">Choi, Jung Woo</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :365-371 Sep, 2022
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2022 IEEE International Test Conference (ITC)
PLink https://login.libproxy.scu.edu/login?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edseee&AN=edseee.9983885
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ITC50671.2022.00045
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 365
    Titles:
      – TitleFull: Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: von Staudt, Hans Martin
      – PersonEntity:
          Name:
            NameFull: Elnawawy, Luai Tarek
      – PersonEntity:
          Name:
            NameFull: Wang, Sarah
      – PersonEntity:
          Name:
            NameFull: Ping, Larry
      – PersonEntity:
          Name:
            NameFull: Choi, Jung Woo
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Type: published
              Y: 2022
          Identifiers:
            – Type: isbn-print
              Value: 9781665462709
            – Type: issn-print
              Value: 23782250
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2022 IEEE International Test Conference (ITC), Test Conference (ITC), 2022 IEEE International, ITC
              Type: main
ResultId 1