Modeling of In-chip Current-Temperature Distribution of SiC Power MOSFETs during Fast Switching Events

Bibliographic Details
Title: Modeling of In-chip Current-Temperature Distribution of SiC Power MOSFETs during Fast Switching Events
Authors: Race, Salvatore, Kovacevic-Badstuebner, Ivana, Stark, Roger, Tsibizov, Alexander, Popescu, Dan, Popescu, Bogdan, Grossner, Ulrike
Source: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :265-268 May, 2022
Relation: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Database: IEEE Xplore Digital Library