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An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction

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Title: An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction
Authors: Yu, Xiao, Bennin, Kwabena Ebo, Liu, Jin, Keung, Jacky Wai, Yin, Xiaofei, Xu, Zhou
Source: 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER) Software Analysis, Evolution and Reengineering (SANER), 2019 IEEE 26th International Conference on. :298-309 Feb, 2019
Relation: 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER)
Database: IEEE Xplore Digital Library
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  Data: 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER)
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        Value: 10.1109/SANER.2019.8668033
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        PageCount: 12
        StartPage: 298
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            NameFull: Yu, Xiao
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            NameFull: Bennin, Kwabena Ebo
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            NameFull: Liu, Jin
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            NameFull: Keung, Jacky Wai
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            NameFull: Yin, Xiaofei
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            NameFull: Xu, Zhou
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            – D: 01
              M: 02
              Type: published
              Y: 2019
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              Value: 9781728105918
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