Yu, X., Bennin, K. E., Liu, J., Keung, J. W., Yin, X., & Xu, Z. (2019). An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction. 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), Software Analysis, Evolution and Reengineering (SANER), 2019 IEEE 26th International Conference on, 298-309. https://doi.org/10.1109/SANER.2019.8668033
Chicago Style (17th ed.) CitationYu, Xiao, Kwabena Ebo Bennin, Jin Liu, Jacky Wai Keung, Xiaofei Yin, and Zhou Xu. "An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction." 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), Software Analysis, Evolution and Reengineering (SANER), 2019 IEEE 26th International Conference on 2019: 298-309. https://doi.org/10.1109/SANER.2019.8668033.
MLA (8th ed.) CitationYu, Xiao, et al. "An Empirical Study of Learning to Rank Techniques for Effort-Aware Defect Prediction." 2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), Software Analysis, Evolution and Reengineering (SANER), 2019 IEEE 26th International Conference on, 2019, pp. 298-309, https://doi.org/10.1109/SANER.2019.8668033.
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