3D-Printed Optics for Wafer-Scale Probing

Bibliographic Details
Title: 3D-Printed Optics for Wafer-Scale Probing
Authors: Trappen, Mareike, Blaicher, Matthias, Dietrich, Philipp-Immanuel, Hoose, Tobias, Xu, Yilin, Billah, Muhammad Rodlin, Freude, Wolfgang, Koos, Christian
Source: 2018 European Conference on Optical Communication (ECOC) Optical Communication (ECOC), 2018 European Conference on. :1-3 Sep, 2018
Relation: 2018 European Conference on Optical Communication (ECOC)
Database: IEEE Xplore Digital Library