An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements
| Title: | An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements |
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| Authors: | Votsi, H., Li, C., Aaen, P.H., Ridler, N.M. |
| Source: | IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 27(11):1034-1036 Nov, 2017 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 15311309 15581764 |
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| DOI: | 10.1109/LMWC.2017.2750086 |
| Published in: | IEEE Microwave and Wireless Components Letters, Microwave and Wireless Components Letters, IEEE, IEEE Microw. Wireless Compon. Lett. |