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An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements

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Title: An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements
Authors: Votsi, H., Li, C., Aaen, P.H., Ridler, N.M.
Source: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 27(11):1034-1036 Nov, 2017
Database: IEEE Xplore Digital Library
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  Data: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 27(11):1034-1036 Nov, 2017
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        Value: 10.1109/LMWC.2017.2750086
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        PageCount: 3
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              Type: published
              Y: 2017
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