Sample holder for electron microscopy
| Title: | Sample holder for electron microscopy |
|---|---|
| Patent Number: | 11322,330 |
| Publication Date: | May 03, 2022 |
| Appl. No: | 17/209491 |
| Application Filed: | March 23, 2021 |
| Abstract: | The apparatus is for use with an electron microscope, a sample, a source of high pressure gas and a vacuum pump system. The apparatus includes a holder part a body part and a Joule-Thomson refrigerator. The holder part is adapted to receive the sample and adapted to present the sample to the microscope for inspection in use. The body part defines a cavity, the cavity being evacuated by the vacuum pump system for use. The refrigerator is disposed within the cavity and thermally-coupled to the holder part, the refrigerator being coupled in use to the source of high pressure gas to maintain the sample at about a predetermined temperature. |
| Inventors: | Sciaini, German (Waterloo, CA); Petruk, Ariel A. (Waterloo, CA) |
| Claim: | 1. Apparatus for use with an electron microscope, a sample, a source of high pressure gas and a vacuum pump system, the apparatus comprising: a holder part adapted to receive the sample and adapted to present the sample to the microscope for inspection in use; a body part defining a cavity, the cavity being evacuated by the vacuum pump system for use; and a Joule-Thomson refrigerator disposed within the cavity and thermally-coupled to the holder part, the refrigerator being coupled in use to the source of high pressure gas to maintain the sample at about a predetermined temperature. |
| Claim: | 2. Apparatus according to claim 1 , wherein the holder part comprises a sampling end, the sampling end being adapted to receive the sample. |
| Claim: | 3. Apparatus according to claim 2 , further comprising a conductor, the refrigerator being thermally-coupled to the sampling end by the conductor. |
| Claim: | 4. Apparatus according to claim 3 , wherein the conductor is flexible. |
| Claim: | 5. Apparatus according, to claim 4 , wherein the body part is releasably coupled to the holder part and coupled to the refrigerator, the conductor being sized and dimensioned to permit, if the body part and the holder part are separated and operatively positioned, connection of the conductor to one or more of the body part and the holder part. |
| Claim: | 6. Apparatus according to claim 5 , further comprising a screw-operated clamp operatively connected to the refrigerator and adapted to permit said connection of the conductor. |
| Claim: | 7. Apparatus according to claim 3 , wherein the holder part composes an insulator having a passage and constructed of thermally insulating material, the refrigerator and the sampling end being thermally coupled via the passage. |
| Claim: | 8. Apparatus according to claim 7 , wherein the refrigerator is adapted to maintain the sample in cryogenic conditions. |
| Claim: | 9. Apparatus according to claim 1 , wherein the refrigerator is adapted to maintain the sample in cryogenic conditions. |
| Patent References Cited: | 2006/0255290 November 2006 Bhadare 2007/0234751 October 2007 Nagamune 2009/0019862 January 2009 Noe et al. 2197981 June 1988 |
| Other References: | International Search Report dated Nov. 14, 2019, Application No. PCT/CA2019/051251. cited by applicant |
| Primary Examiner: | Nguyen, Kiet T |
| Attorney, Agent or Firm: | The Dobrusin Law Firm, PC |
| Accession Number: | edspgr.11322330 |
| Database: | USPTO Patent Grants |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://ppubs.uspto.gov/pubwebapp/external.html?q=(%2211322%2C330%22).pn.&db=USPAT&type=ids Name: EDS - USPTO Patent Grants Category: fullText Text: View record from USPTO Patent Grants MouseOverText: View record from USPTO Patent Grants – Url: https://resolver.ebsco.com/c/xy5jbn/result?sid=EBSCO:edspgr&genre=article&issn=&ISBN=&volume=&issue=&date=20220503&spage=&pages=&title=Sample holder for electron microscopy&atitle=Sample%20holder%20for%20electron%20microscopy&aulast=Sciaini%2C%20German&id=DOI: Name: Full Text Finder (for New FTF UI) (s8985755) Category: fullText Text: Find It @ SCU Libraries MouseOverText: Find It @ SCU Libraries |
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| Items | – Name: Title Label: Title Group: Ti Data: Sample holder for electron microscopy – Name: DocumentID Label: Patent Number Group: Patent Data: 11322,330 – Name: DateEntry Label: Publication Date Group: Patent Data: May 03, 2022 – Name: DocumentID Label: Appl. No Group: Patent Data: 17/209491 – Name: DateFiled Label: Application Filed Group: Patent Data: March 23, 2021 – Name: Abstract Label: Abstract Group: Ab Data: The apparatus is for use with an electron microscope, a sample, a source of high pressure gas and a vacuum pump system. The apparatus includes a holder part a body part and a Joule-Thomson refrigerator. The holder part is adapted to receive the sample and adapted to present the sample to the microscope for inspection in use. The body part defines a cavity, the cavity being evacuated by the vacuum pump system for use. The refrigerator is disposed within the cavity and thermally-coupled to the holder part, the refrigerator being coupled in use to the source of high pressure gas to maintain the sample at about a predetermined temperature. – Name: Author Label: Inventors Group: Patent Data: <searchLink fieldCode="ZA" term="%22Sciaini%2C+German%22">Sciaini, German</searchLink> (Waterloo, CA); <searchLink fieldCode="ZA" term="%22Petruk%2C+Ariel+A%2E%22">Petruk, Ariel A.</searchLink> (Waterloo, CA) – Name: Comment Label: Claim Group: Patent Data: 1. Apparatus for use with an electron microscope, a sample, a source of high pressure gas and a vacuum pump system, the apparatus comprising: a holder part adapted to receive the sample and adapted to present the sample to the microscope for inspection in use; a body part defining a cavity, the cavity being evacuated by the vacuum pump system for use; and a Joule-Thomson refrigerator disposed within the cavity and thermally-coupled to the holder part, the refrigerator being coupled in use to the source of high pressure gas to maintain the sample at about a predetermined temperature. – Name: Comment Label: Claim Group: Patent Data: 2. Apparatus according to claim 1 , wherein the holder part comprises a sampling end, the sampling end being adapted to receive the sample. – Name: Comment Label: Claim Group: Patent Data: 3. Apparatus according to claim 2 , further comprising a conductor, the refrigerator being thermally-coupled to the sampling end by the conductor. – Name: Comment Label: Claim Group: Patent Data: 4. Apparatus according to claim 3 , wherein the conductor is flexible. – Name: Comment Label: Claim Group: Patent Data: 5. Apparatus according, to claim 4 , wherein the body part is releasably coupled to the holder part and coupled to the refrigerator, the conductor being sized and dimensioned to permit, if the body part and the holder part are separated and operatively positioned, connection of the conductor to one or more of the body part and the holder part. – Name: Comment Label: Claim Group: Patent Data: 6. Apparatus according to claim 5 , further comprising a screw-operated clamp operatively connected to the refrigerator and adapted to permit said connection of the conductor. – Name: Comment Label: Claim Group: Patent Data: 7. Apparatus according to claim 3 , wherein the holder part composes an insulator having a passage and constructed of thermally insulating material, the refrigerator and the sampling end being thermally coupled via the passage. – Name: Comment Label: Claim Group: Patent Data: 8. Apparatus according to claim 7 , wherein the refrigerator is adapted to maintain the sample in cryogenic conditions. – Name: Comment Label: Claim Group: Patent Data: 9. Apparatus according to claim 1 , wherein the refrigerator is adapted to maintain the sample in cryogenic conditions. – Name: Ref Label: Patent References Cited Group: Patent Data: <searchLink fieldCode="RF" term="%222006%2E0255290%22">2006/0255290</searchLink> November 2006 Bhadare<br /><searchLink fieldCode="RF" term="%222007%2E0234751%22">2007/0234751</searchLink> October 2007 Nagamune<br /><searchLink fieldCode="RF" term="%222009%2E0019862%22">2009/0019862</searchLink> January 2009 Noe et al.<br /><searchLink fieldCode="RF" term="%222197981%22">2197981</searchLink> June 1988<br /> – Name: Ref Label: Other References Group: Patent Data: International Search Report dated Nov. 14, 2019, Application No. PCT/CA2019/051251. cited by applicant – Name: AuthorEditor Label: Primary Examiner Group: Patent Data: <searchLink fieldCode="ZE" term="%22Nguyen%2C+Kiet+T%22">Nguyen, Kiet T</searchLink> – Name: AuthorCorporate Label: Attorney, Agent or Firm Group: Patent Data: <searchLink fieldCode="ZG" term="%22The+Dobrusin+Law+Firm%2C+PC%22">The Dobrusin Law Firm, PC</searchLink> – Name: AN Label: Accession Number Group: ID Data: edspgr.11322330 |
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| RecordInfo | BibRecord: BibEntity: Languages: – Text: English Titles: – TitleFull: Sample holder for electron microscopy Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sciaini, German – PersonEntity: Name: NameFull: Petruk, Ariel A. IsPartOfRelationships: – BibEntity: Dates: – D: 03 M: 05 Text: May 03, 2022 Type: published Y: 2022 |
| ResultId | 1 |