Magnetoresistive element and method for manufacturing the same

Bibliographic Details
Title: Magnetoresistive element and method for manufacturing the same
Patent Number: 9,368,717
Publication Date: June 14, 2016
Appl. No: 14/200742
Application Filed: March 07, 2014
Abstract: According to one embodiment, a magnetoresistive element is disclosed. The magnetoresistive element includes a reference layer. The reference layer includes a first region, and a second region provided outside the first region to surround the same. The second region contains an element contained in the first region and another element being different from the element. The magnetoresistive element further includes a storage layer, and a tunnel barrier layer provided between the reference layer and the storage layer. The storage layer is free from the another element.
Inventors: Toko, Masaru (Seoul, KR); Nakayama, Masahiko (Seoul, KR); Sugiura, Kuniaki (Seoul, KR); Hashimoto, Yutaka (Seoul, KR); Kai, Tadashi (Seoul, KR); Murayama, Akiyuki (Seoul, KR); Kishi, Tatsuya (Seoul, KR)
Assignees: KABUSHIKI KAISHA TOSHIBA (Tokyo, JP)
Claim: 1. A magnetoresistive element, comprising: a reference layer comprising a first region, and a second region provided outside the first region to surround the first region, the second region containing an element contained in the first region and another element different from the element, wherein the another element is at least one element selected from the group consisting of As, Ge, Ga, Sb, In, N, Ar, He, O, Si, B, C, Zr, Tb, S, Se, P, and Ti; a storage layer which is free of the another element; and a tunnel barrier layer provided between the reference layer and the storage layer, wherein a width of the tunnel barrier layer and a width of the storage layer are larger than a width of the reference layer.
Claim: 2. The element according to claim 1 , further comprising: a shift cancelling layer provided on the reference layer, wherein the shift cancelling layer comprises a third region which is free of the another element, and a fourth region provided outside the third region to surround the third region, wherein the fourth region contains an element contained in the third region and the another element.
Claim: 3. The element according to claim 2 , further comprising: a cap layer provided on the shift cancelling layer.
Claim: 4. A magnetoresistive element, comprising: a reference layer comprising a first region, and a second region provided outside the first region to surround the first region, the second region containing an element contained in the first region and another element different from the element, wherein the another element is at least one element selected from the group consisting of As, Ge, Ga, Sb, In, N, Ar, He, O, Si, B, C, Zr, Tb, S, Se, P, and Ti; a storage layer which is free of the another element; and a tunnel barrier layer provided between the reference layer and the storage layer, wherein a width of the tunnel barrier layer is approximately equal to a width of the storage layer.
Claim: 5. The element according to claim 2 , wherein a width of the shift cancelling layer is approximately equal to the width of the reference layer.
Claim: 6. The element according to claim 2 , further comprising: an insulating sidewall covering side walls of the reference layer and the shift cancelling layer.
Claim: 7. The element according to claim 1 , wherein the second region is demagnetized.
Claim: 8. The element according to claim 2 , wherein the fourth region is demagnetized.
Claim: 9. A magnetoresistive element, comprising: a shift cancelling layer comprising a first region, and a second region provided outside the first region to surround the first region, the second region containing an element contained in the first region and another element different from the element; a reference layer provided on the shift cancelling layer, wherein the reference layer is free of the another element; a tunnel barrier layer provided on the reference layer; and a storage layer provided on the tunnel barrier layer, wherein the storage layer is free of the another element.
Claim: 10. The element according to claim 9 , wherein the another element is at least one element selected from the group consisting of As, Ge, Ga, Sb, In, N, Ar, He, F, Cl, Br, I, O, Si, B, C, Zr, Tb, S, Se, P, and Ti.
Claim: 11. The element according to claim 10 , wherein the second region is demagnetized.
Patent References Cited: 6165803 December 2000 Chen et al.
6297983 October 2001 Bhattacharyya
6365286 April 2002 Inomata et al.
6391430 May 2002 Fullerton et al.
6479353 November 2002 Bhattacharyya
6483675 November 2002 Araki et al.
6713830 March 2004 Nishimura et al.
6829121 December 2004 Ikeda et al.
6895658 May 2005 Shimazawa et al.
6965138 November 2005 Nakajima et al.
6987652 January 2006 Koganei
7220601 May 2007 Hwang et al.
7586781 September 2009 Saitoh et al.
7619431 November 2009 De Wilde et al.
7746603 June 2010 Gill et al.
7768824 August 2010 Yoshikawa et al.
7916430 March 2011 Kagami et al.
7957184 June 2011 Yoshikawa et al.
8119018 February 2012 Ikemoto et al.
8130474 March 2012 Childress et al.
8139405 March 2012 Yoshikawa et al.
8154915 April 2012 Yoshikawa et al.
8218355 July 2012 Kitagawa et al.
8223533 July 2012 Ozeki et al.
8268713 September 2012 Yamagishi et al.
8270125 September 2012 Gill
8339841 December 2012 Iwayama
8475672 July 2013 Iori et al.
8710605 April 2014 Takahashi et al.
8716034 May 2014 Ohsawa et al.
8884389 November 2014 Toko
8928055 January 2015 Saida et al.
8963264 February 2015 Dimitrov et al.
2001/0022742 September 2001 Bhattacharyya
2001/0024347 September 2001 Shimazawa et al.
2002/0070361 June 2002 Mack et al.
2002/0146851 October 2002 Okazawa et al.
2002/0167059 November 2002 Nishimura et al.
2002/0182442 December 2002 Ikeda et al.
2003/0067800 April 2003 Koganei
2004/0080876 April 2004 Sugita et al.
2004/0188732 September 2004 Fukuzumi
2005/0020076 January 2005 Lee et al.
2005/0048675 March 2005 Ikeda
2005/0174876 August 2005 Katoh
2005/0254289 November 2005 Nakajima et al.
2005/0274997 December 2005 Gaidis et al.
2006/0043317 March 2006 Ono et al.
2006/0105570 May 2006 Hautala et al.
2007/0164338 July 2007 Hwang et al.
2008/0122005 May 2008 Horsky et al.
2009/0080238 March 2009 Yoshikawa et al.
2009/0191696 July 2009 Shao et al.
2009/0243008 October 2009 Kitagawa et al.
2009/0285013 November 2009 Saitoh et al.
2010/0097846 April 2010 Sugiura et al.
2010/0135068 June 2010 Ikarashi et al.
2010/0183902 July 2010 Kim et al.
2010/0230770 September 2010 Yoshikawa et al.
2011/0037108 February 2011 Sugiura et al.
2011/0059557 March 2011 Yamagishi et al.
2011/0159316 June 2011 Wang et al.
2011/0174770 July 2011 Hautala
2011/0211389 September 2011 Yoshikawa et al.
2011/0222335 September 2011 Yoshikawa et al.
2011/0233697 September 2011 Kajiyama
2012/0032288 February 2012 Tomioka
2012/0056253 March 2012 Iwayama et al.
2012/0074511 March 2012 Takahashi et al.
2012/0135543 May 2012 Shin et al.
2012/0139019 June 2012 Iba
2012/0244639 September 2012 Ohsawa et al.
2012/0244640 September 2012 Ohsawa et al.
2013/0017626 January 2013 Tomioka
2013/0069186 March 2013 Toko et al.
2013/0099338 April 2013 Nakayama et al.
2013/0181305 July 2013 Nakayama et al.
2014/0327096 November 2014 Guo
2014/0356979 December 2014 Annunziata et al.
2015/0069542 March 2015 Nagamine et al.
04241481 August 1992
09041138 February 1997
2000156531 June 2000
2001052316 February 2001
2001308292 November 2001
2002176211 June 2002
2002280640 September 2002
2002299726 October 2002
2002299727 October 2002
2002305290 October 2002
2003110162 April 2003
2003536199 December 2003
2004006589 January 2004
2004500483 January 2004
2005209951 August 2005
2006005342 January 2006
2006510196 March 2006
2006165031 June 2006
2007053315 March 2007
2007234897 September 2007
2007305610 November 2007
2008066612 March 2008
2008522429 June 2008
2008153527 July 2008
2008171882 July 2008
2008193103 August 2008
2008282940 November 2008
2009054715 March 2009
2009081216 April 2009
2009239120 October 2009
2010003342 January 2010
2010113782 May 2010
2011040580 February 2011
2011054873 March 2011
2012244051 December 2012
2013153232 August 2013
2005088745 September 2005












Other References: English translation of Japanese Kokai 2006-165031 to Matsuura et al., Feb. 2015. cited by examiner
U.S. Appl. No. 14/202,802; First Named Inventor: Masahiko Nakayama; Title: “Magnetoresistive Element and Method of Manufacturing the Same”; Filed: Mar. 10, 2014. cited by applicant
U.S. Appl. No. 61/875,577 ; First Named Inventor: Masahiko Nakayama; Title: “Magnetoresistive Element and Method of Manufacturing the Same”; Filed: Sep. 9, 2013. cited by applicant
U.S. Appl. No. 14/203,249; First Named Inventor: Masahiko Nakayama; Title: “Magnetic Memory and Method of Manufacturing the Same”; Filed: Mar. 10, 2014. cited by applicant
U.S. Appl. No. 61/876,057 ; First Named Inventor: Masahiko Nakayama; Title: “Magnetic Memory and Method of Manufacturing the Same”; Filed: Sep. 10, 2013. cited by applicant
U.S. Appl. No. 14/200,670; First Named Inventor: Kuniaki Sugiura; Title: “Magnetoresistive Element and Method of Manufacturing the Same ”; Filed: Mar. 7, 2014. cited by applicant
U.S. Appl. No. 61/876,081 ; First Named Inventor: Kuniaki Sugiura; Title: “Magnetoresistive Element and Method Thereof”; Filed: Sep. 10, 2013. cited by applicant
Related U.S. Appl. No. 13/226,868; First Named Inventor: Yuichi Ohsawa; Title: “Method of Manufacturing Magnetic Memory”; Filed: Sep. 7, 2011. cited by applicant
Related U.S. Appl. No. 13/226,960 ; First Named Inventor: Yuichi Ohsawa; Title: “Method of Manufacturing Multilayer Film”; Filed: Sep. 7, 2011. cited by applicant
Related U.S. Appl. No. 13/231,894; First Named Inventor: Shigeki Takahashi; Title: “Magnetic Memory and Method of Manufacturing the Same”; Filed: Sep. 13, 2011. cited by applicant
Related U.S. Appl. No. 13/604,537; First Named Inventor: Masahiko Nakayama; Title: “Magnetic Memory Element and Magnetic Memory”; Filed: Sep. 5, 2012. cited by applicant
Albert, et al., “Spin-polarized current switching of a Co thin film nanomagnet”, Applied Physics Letters, vol. 77, No. 23, Oct. 7, 2000, 3809-3811. cited by applicant
Otani, et al., “Microfabrication of Magnetic Tunnel Junctions Using CH3OH Etching”, IEEE Transactions on Magnetics, vol. 43, No. 6, Jun. 6, 2007, 2776-2778. cited by applicant
Primary Examiner: Prenty, Mark
Attorney, Agent or Firm: Holtz, Holtz & Volek PC
Accession Number: edspgr.09368717
Database: USPTO Patent Grants
More Details
Language:English