Oxide material, patterning substrate, method of forming a pattern, method of producing an imprint transfer mold, method of producing a recording medium, imprint transfer mold, and recording medium
| Title: | Oxide material, patterning substrate, method of forming a pattern, method of producing an imprint transfer mold, method of producing a recording medium, imprint transfer mold, and recording medium |
|---|---|
| Patent Number: | 8,206,768 |
| Publication Date: | June 26, 2012 |
| Appl. No: | 12/443039 |
| Application Filed: | September 28, 2007 |
| Abstract: | An oxide material (102) is used as masking for patterning by etching which is performed with respect to a substrate or a material laminated on the substrate (101). The oxide material is also used in a multi-step etching which is performed by using a resist (103) formed on the oxide material as a mask. The etching rate of the oxide material for a reaction gas containing an inert gas or hydrogen is higher than the etching rate of the resist for the reaction gas containing an inert gas or hydrogen, while the etching rate of the oxide material for a fluorine-containing gas is lower than the etching rate of the material, which is to be patterned by using the oxide material as a mask, for the fluorine-containing gas. In addition, the oxide material is soluble in a weak acid. |
| Inventors: | Fujimura, Megumi (Saitama, JP); Hosoda, Yasuo (Saitama, JP) |
| Assignees: | Pioneer Corporation (Tokyo, JP) |
| Claim: | 1. A substrate for patterning by etching, comprising: a silicon substrate; a bismuth oxide film formed on an upper surface of the silicon substrate; and an electron beam resist layer formed on the bismuth oxide film. |
| Claim: | 2. The substrate according to claim 1 , wherein the bismuth oxide comprises bismuth in an amount (x) of 0.4 |
| Claim: | 3. The substrate according to claim 1 , wherein the bismuth oxide film comprises Bi 2 O 3 and one or more components selected from the group consisting of: Ti (titanium), V (vanadium), Cr (chromium), Mn (manganese), Fe (iron), Co (cobalt), Ni (nickel), Cu (copper), Zn (zinc), Zr (zirconium), Nb (niobium), Mo (molybdenum), Ru (ruthenium), Pd (palladium), Ag (silver), Cd (cadmium), Ta (tantalum), W (tungsten), Pt (platinum), Au (gold), Al (aluminum), Si (silicon), Ga (gallium), Ge (germanium), In (indium), Sn (tin), Sb (antimony), Mg (magnesium), Ca (calcium), Sr (strontium), nitrogen, metal nitride, carbon, metal carbide, sulfur and metal sulfide. |
| Claim: | 4. The substrate according to claim 1 , wherein an etching rate of the bismuth oxide film is greater than the etching rate of the resist layer, in an etching process from argon gas or trifluoromethane (CHF 3) gas. |
| Claim: | 5. The substrate according to claim 4 , wherein the etching rate of the bismuth oxide film is about 1.1 times greater than the etching rate of the resist layer. |
| Claim: | 6. The substrate according to claim 1 , wherein an etching rate of the bismuth oxide film is less than the etching rate of the substrate layer, in an etching process from tetrafluoromethane (CF 4) gas. |
| Claim: | 7. The substrate according to claim 6 , wherein the etching rate of the silicon substrate is about 13.1 times greater than the etching rate of the bismuth oxide film layer. |
| Claim: | 8. The substrate according to claim 1 , further comprising one or more additional layers formed on the electron beam resist layer, the one or more additional layers selected from the group consisting of: a magnetic film, a titanium film and a tantalum film. |
| Claim: | 9. A masking material for pattern etching a substrate, comprising bismuth oxide, wherein the bismuth oxide comprises bismuth in an amount (x) of 0.4 |
| Claim: | 10. The masking material according to claim 9 , consisting essentially of bismuth oxide. |
| Claim: | 11. The masking material according to claim 9 , comprising Bi 2 O 3 and one or more components selected from the group consisting of: Ti (titanium), V (vanadium), Cr (chromium), Mn (manganese), Fe (iron), Co (cobalt), Ni (nickel), Cu (copper), Zn (zinc), Zr (zirconium), Nb (niobium), Mo (molybdenum), Ru (ruthenium), Pd (palladium), Ag (silver), Cd (cadmium), Ta (tantalum), W (tungsten), Pt (platinum), Au (gold), Al (aluminum), Si (silicon), Ga (gallium), Ge (germanium), In (indium), Sn (tin), Sb (antimony), Mg (magnesium), Ca (calcium), Sr (strontium), nitrogen, metal nitride, carbon, metal carbide, sulfur and metal sulfide. |
| Current U.S. Class: | 426/446 |
| Patent References Cited: | 4634495 January 1987 Gobrecht et al. 5124311 June 1992 Mori et al. 5134029 July 1992 Kuromitsu et al. 6846616 January 2005 Kobayashi et al. 7252923 August 2007 Kobayashi 2008/0070393 March 2008 Miyairi et al. 60-243284 December 1985 2002-198495 July 2002 2004-119414 April 2004 2006-156422 June 2006 2006-244694 September 2006 |
| Primary Examiner: | Speer, Timothy |
| Attorney, Agent or Firm: | Young & Thompson |
| Accession Number: | edspgr.08206768 |
| Database: | USPTO Patent Grants |
| Language: | English |
|---|