SENSORS INCORPORATING ANTIBODIES AND METHODS OF MAKING AND USING THE SAME

Bibliographic Details
Title: SENSORS INCORPORATING ANTIBODIES AND METHODS OF MAKING AND USING THE SAME
Document Number: 20120122736
Publication Date: May 17, 2012
Appl. No: 13/201181
Application Filed: February 11, 2010
Abstract: A sensor comprising an electronic circuit electrically coupled to a type III-V semiconductor material, for example indium arsenide (InAs) and an antibody contacting the type III-V semiconductor material. The sensor produces measurable N changes in the electrical properties of the semiconductor upon antibody-antigen binding events. Electrical properties measurable by the electronic device may include resistivity, capacitance, impedance, and inductance. A method of detecting an antigen using sensors of the invention. A method of detecting a reaction of an analyte to a stimulus using sensors of the invention. Sensor arrays comprising multiple sensors of the invention.
Inventors: Angelo, R. Michael (Berkeley, CA, US); Brown, April S. (Hillsborough, NC, US); Wolter, Scott (Hillsborough, NC, US); Lampert, William V. (Raleigh, NC, US)
Assignees: DUKE UNIVERSITY (Durham, NC, US)
Claim: 1.-27. (canceled)
Claim: 28. A sensor comprising an electronic circuit electrically coupled to a type III-V semiconductor material and an antibody contacting the type III-V semiconductor material.
Claim: 29. The sensor of claim 28, wherein the electronic circuit measures an electrical property of the type III-V semiconductor material.
Claim: 30. The sensor of claim 29, wherein the property is at least one of resistivity, capacitance, impedance, and inductance.
Claim: 31. The sensor of claim 30, wherein the property is resistivity.
Claim: 32. The sensor of claim 31, wherein the resistivity is sheet resistivity, and the sheet resistivity is measured in a van der Pauw configuration.
Claim: 33. The sensor of claim 28, wherein the type III-V semiconductor material comprises at least one of indium arsenide (InAs), gallium arsenide (GaAs), gallium nitride (GaN), indium nitride (InN) and a combination thereof.
Claim: 34. The sensor of claim 28, wherein the antibody comprises at least one of an IgG protein, an IgA protein, an IgM protein, an IgD protein, and an IgE protein.
Claim: 35. The sensor of claim 28, wherein the antibody binds a virus, a pathogen, a fungus, a bacterium, a prion, a protein, an amino acid, a nucleic acid, a carbohydrate, a hormone, a chemical compound, or a chemical reaction intermediate.
Claim: 36. The sensor of claim 28, wherein the antibody binds Tumor Necrosis Factor (TNF), Human Serum Albumin (HSA), Interleukin 1β (IL 1β), Interleukin 6 (IL 6), Follicle Stimulating Hormone (FSH), Interferon γ, or Human Chorionic Gonadotropin (HCG).
Claim: 37. The sensor of claim 28, further comprising an additional antibody, the antibody binding a first antigen, the additional antibody binding a second antigen.
Claim: 38. The sensor of claim 28, further comprising a well.
Claim: 39. A sensor array comprising a plurality of sensors of claim 28.
Claim: 40. The sensor array of claim 39, comprising greater than about ten sensors of claim 1.
Claim: 41. The sensor array of claim 39, comprising at least two different antibodies.
Claim: 42. A method of detecting an antigen comprising: making a first measurement of an electrical property of a sensor comprising an antibody contacting a type III-V semiconductor material; contacting the sensor with an analyte that may or may not contain an antigen; and subsequently making a second measurement of the electrical property of the sensor, wherein a difference between the first measurement and the second measurement indicates the presence of an antigen.
Claim: 43. The method of claim 42, wherein the electrical property is at least one of resistivity, capacitance, impedance, and inductance.
Claim: 44. The method of claim 43, wherein the electrical property is resistivity.
Claim: 45. The method of claim 44, wherein the resistivity is sheet resistivity, and the sheet resistivity is measured in a van der Pauw configuration.
Claim: 46. The method of claim 42, wherein the type III-V semiconductor material comprises at least one of indium arsenide (InAs), gallium arsenide (GaAs), gallium nitride (GaN), indium nitride (InN) and a combination thereof.
Claim: 47. The method of claim 42, wherein the antibody comprises at least one of an IgG protein, an IgA protein, an IgM protein, an IgD protein, and an IgE protein.
Claim: 48. The method of claim 42, wherein the analyte comprises at least one of a bodily fluid of an animal, an extract of a plant, an industrial process stream, air, water, a foodstuff, and a combination thereof.
Claim: 49. The method of claim 48, wherein the bodily fluid of an animal is at least one of blood, saliva, urine, mucus, sweat, tears, and a combination thereof.
Claim: 50. The method of claim 42, wherein the antigen is a virus, a pathogen, a fungus, a bacterium, a prion, a protein, an amino acid, a nucleic acid, a carbohydrate, a hormone, a chemical compound, or a chemical reaction intermediate.
Claim: 51. The method of claim 42, wherein the antigen is Tumor Necrosis Factor (TNF), Human Serum Albumin (HSA), Interleukin 1β (IL 1β), Interleukin 6 (IL 6), Follicle Stimulating Hormone (FSH), Interferon γ, or Human Chorionic Gonadotropin (HCG).
Claim: 52. A method of detecting a reaction of an analyte to a stimulus comprising: making a first measurement of an electrical property of a first sensor and a second sensor, wherein the first sensor and the second sensor comprise antibodies contacting a type III-V semiconductor material; contacting the first sensor with an analyte that has not been exposed to the stimulus; contacting the second sensor with an analyte that has been exposed to the stimulus; and subsequently making a second measurement of the electrical property of the first sensor and the second sensor, wherein a difference between the first measurement and the second measurement for the first sensor indicates a response of the first sensor to the analyte that has not been exposed to the stimulus, and a difference between the first measurement and the second measurement for the second sensor indicates a response of the second sensor to the analyte that has been exposed to the stimulus, and wherein a difference between the response of the first sensor and the response of the second sensor indicates a reaction of the analyte to the stimulus.
Claim: 53.-61. (canceled)
Claim: 62. A method of making a sensor incorporating an antibody comprising contacting a type III-V semiconductor material with an antibody and coupling a circuit capable of measuring an electrical property of the type III-V semiconductor material to the type III-V semiconductor material.
Claim: 63.-68. (canceled)
Current U.S. Class: 506/18
Current International Class: 01; 40; 01; 01; 01; 12; 12; 01
Accession Number: edspap.20120122736
Database: USPTO Patent Applications
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Language:English