Bibliographic Details
| Title: |
POLISHING LIQUID COMPOSITION FOR MAGNETIC DISK SUBSTRATE |
| Document Number: |
20110203186 |
| Publication Date: |
August 25, 2011 |
| Appl. No: |
13/127735 |
| Application Filed: |
November 04, 2009 |
| Abstract: |
The present invention provides a polishing composition for a magnetic disk substrate that can reduce scratches and surface roughness of a polished substrate without impairing the productivity, and a method for manufacturing a magnetic disk substrate using the polishing composition. The polishing composition for a magnetic disk substrate includes colloidal silica having a Δ CV value of 0 to 10% and water. The Δ CV value is a difference (Δ CV=CV30−CV90) between a value (CV30) obtained by dividing a standard deviation based on a scattering intensity distribution at a detection angle of 30° according to a dynamic light scattering method by an average particle size based on the scattering intensity distribution and multiplying the result by 100 and a value (CV90) obtained by dividing a standard deviation based on a scattering intensity distribution at a detection angle of 90° according to the dynamic light scattering method by an average particle size based on the scattering intensity distribution and multiplying the result by 100. |
| Inventors: |
Oshima, Yoshiaki (Wakayama, JP); Hamaguchi, Takeshi (Wakayama, JP); Sato, Kanji (Wakayama, JP); Yamaguchi, Norihito (Wakayama, JP); Doi, Haruhiko (Wakayama, JP) |
| Claim: |
1. A polishing composition for a magnetic disk substrate comprising: colloidal silica; and water, wherein the colloidal silica has a Δ CV value of 0 to 10%, where the Δ CV value is a difference (Δ CV=CV30−CV90) between a value (CV30) obtained by dividing a standard deviation based on a scattering intensity distribution at a detection angle of 30° according to a dynamic light scattering method by an average particle size based on the scattering intensity distribution and multiplying the result by 100 and a value (CV90) obtained by dividing a standard deviation based on a scattering intensity distribution at a detection angle of 90° according to the dynamic light scattering method by an average particle size based on the scattering intensity distribution and multiplying the result by 100, the CV90 value of the colloidal silica is 1 to 35%, and the average particle size of the colloidal silica based on the scattering intensity distribution at the detection angle of 90° according to the dynamic light scattering method is 1 to 40 nm. |
| Claim: |
2. The polishing composition for a magnetic disk substrate according to claim 1, further comprising a water-soluble polymer having an anionic group. |
| Claim: |
3. The polishing composition for a magnetic disk substrate according to claim 2, wherein the water-soluble polymer having the anionic group is a polymer having a constitutional unit expressed by the following general formula (1): [chemical expression included] (where R is a hydrogen atom, a methyl group, or an ethyl group and X is a hydrogen atom, an alkali metal atom, an alkaline-earth metal atom (1/2 atom), ammonium, or organic ammonium). |
| Claim: |
4. The polishing composition for a magnetic disk substrate according to claim 2, wherein the water-soluble polymer having the anionic group is a polymer having a constitutional unit expressed by the following general formula (2): [chemical expression included] (where M is a hydrogen atom, an alkali metal atom, an alkaline-earth metal atom (1/2 atom), ammonium, or organic ammonium and n is 1 or 2). |
| Claim: |
5. The polishing composition for a magnetic disk substrate according to claim 2, wherein the water-soluble polymer having the anionic group is a styrene/isoprenesulfonic acid copolymer. |
| Claim: |
6. The polishing composition for a magnetic disk substrate according to-any-ene of claims 1 to 5 claim 1, wherein the colloidal silica meets the following requirements (a) to (c): (a) sphericity measured by transmission electron microscope observation is 0.75 to 1; (b) a value of surface roughness (SA1/SA2) calculated from a specific surface area (SA1) that is measured by a sodium titration method and a specific surface area (SA2) that is converted from an average particle size (S2) measured by transmission electron microscope observation is 1.3 or more; and (c) the average particle size (S2) is 1 to 40 nm. |
| Claim: |
7. A method for manufacturing a magnetic disk substrate comprising: polishing a substrate to be polished with the polishing composition for a magnetic disk substrate according to claim 1. |
| Claim: |
8. The method for manufacturing a magnetic disk substrate according to claim 7, wherein the substrate is a Ni-P plated aluminum alloy substrate. |
| Current U.S. Class: |
51/298 |
| Current International Class: |
09; 24 |
| Accession Number: |
edspap.20110203186 |
| Database: |
USPTO Patent Applications |
