Investigation of the presence of metal droplets after pulsed InN and GaN epitaxial growth using atomic force microscopy and nanoindentation

Bibliographic Details
Title: Investigation of the presence of metal droplets after pulsed InN and GaN epitaxial growth using atomic force microscopy and nanoindentation
Authors: Terziyska, Penka T., Butcher, Kenneth Scott Alexander, Alexandrov, Dimiter
Source: In Applied Surface Science 1 October 2012 258(24):9997-10001
Database: ScienceDirect
More Details
ISSN:01694332
DOI:10.1016/j.apsusc.2012.06.062
Published in:Applied Surface Science
Language:English