Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions
| Title: | Evaluation of the spectroscopic ellipsometry and dielectric properties of Cr2O3 nanoparticles doped PVDF thin films for future application of organic ferroelectric junctions |
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| Authors: | Al-Hazmi, Farag S., de Leeuw, Dago M., Al-Ghamdi, A.A., Shokr, F.S. |
| Source: | In Optik June 2017 138:207-213 |
| Database: | ScienceDirect |
| ISSN: | 00304026 |
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| DOI: | 10.1016/j.ijleo.2017.03.073 |
| Published in: | Optik |
| Language: | English |