Theoretical and simulation-based assessment of electrically doped junctionless TFET with metal-strip and hetero-material considering interface trap charges
| Title: | Theoretical and simulation-based assessment of electrically doped junctionless TFET with metal-strip and hetero-material considering interface trap charges |
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| Authors: | Chandan, Bandi Venkata, Nigam, Kaushal Kumar |
| Source: | In Microelectronics Reliability June 2024 157 |
| Database: | ScienceDirect |
| ISSN: | 00262714 |
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| DOI: | 10.1016/j.microrel.2024.115393 |
| Published in: | Microelectronics Reliability |
| Language: | English |