Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique
| Title: | Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique |
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| Authors: | Baba, Masakazu, Toh, Katsuaki, Toko, Kaoru, Saito, Noriyuki, Yoshizawa, Noriko, Jiptner, Karolin, Sekiguchi, Takashi, Hara, Kosuke O., Usami, Noritaka, Suemasu, Takashi |
| Source: | In Journal of Crystal Growth 1 June 2012 348(1):75-79 |
| Database: | ScienceDirect |
| ISSN: | 00220248 |
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| DOI: | 10.1016/j.jcrysgro.2012.03.044 |
| Published in: | Journal of Crystal Growth |
| Language: | English |