Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy
| Title: | Atomic-scale characterization of defects in oxygen plasma-treated graphene by scanning tunneling microscopy |
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| Authors: | Pham, Van Dong, González, César, Dappe, Yannick J., Dong, Chengye, Robinson, Joshua A., Trampert, Achim, Engel-Herbert, Roman |
| Source: | In Carbon 30 June 2024 227 |
| Database: | ScienceDirect |
| ISSN: | 00086223 |
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| DOI: | 10.1016/j.carbon.2024.119260 |
| Published in: | Carbon |
| Language: | English |