A Temperature Independent Readout Circuit for ISFET-Based Sensor Applications

Bibliographic Details
Title: A Temperature Independent Readout Circuit for ISFET-Based Sensor Applications
Authors: Moussavi, Elmira, Sisejkovic, Dominik, Singh, Animesh, Kizatov, Daniyar, Leupers, Rainer, Ingebrandt, Sven, Pachauri, Vivek, Merchant, Farhad
Source: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-4 Sep, 2022
Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)
Database: IEEE Xplore Digital Library