Bibliographic Details
| Title: |
Extraction of the Back Channel Mobility in SOI Nanowire MOS Transistors under Substrate Biasing |
| Authors: |
Bergamaschi, Flavio E., Wirth, Gilson I., Barraud, Sylvain, Casse, Mikael, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo A. |
| Source: |
2022 IEEE Latin American Electron Devices Conference (LAEDC) Electron Devices Conference (LAEDC), 2022 IEEE Latin American. :1-4 Jul, 2022 |
| Relation: |
2022 IEEE Latin American Electron Devices Conference (LAEDC) |
| Database: |
IEEE Xplore Digital Library |
