Experimental Assessment of Variability in Junctionless Nanowire nMOS Transistors

Bibliographic Details
Title: Experimental Assessment of Variability in Junctionless Nanowire nMOS Transistors
Authors: De Souza, Michelly, Barraud, Sylvain, Casse, Mikael, Vinet, Maud, Faynor, Olivier, Pavanello, Marcelo Antonio
Source: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :223-226 Sep, 2021
Relation: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)
Database: IEEE Xplore Digital Library