Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
| Title: | Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs |
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| Authors: | Wu, L., Rao, S., Taouil, M., Marinissen, E.J., Kar, G.S., Hamdioui, S. |
| Source: | IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 71(9):2219-2233 Sep, 2022 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189340 15579956 23263814 |
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| DOI: | 10.1109/TC.2021.3125228 |
| Published in: | IEEE Transactions on Computers, Computers, IEEE Transactions on, IEEE Trans. Comput. |