TCAD Comprehensive Silicon Strain Model Using Finite Element Quasi-Fermi Discretization

Bibliographic Details
Title: TCAD Comprehensive Silicon Strain Model Using Finite Element Quasi-Fermi Discretization
Authors: Weingartner, Thomas, Law, Mark E., Green, Keith, Thomas, Andrew, Johnson, Henry, Leger, Polina
Source: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :242-246 Sep, 2021
Relation: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Database: IEEE Xplore Digital Library