Bibliographic Details
| Title: |
Automated Low-Cost SBST Optimization Techniques for Processor Testing |
| Authors: |
Vasudevan, M S, Biswas, Santosh, Sahu, Aryabartta |
| Source: |
2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2021 20th Internationa Conference on Embedded Systems (VLSID), 2021 34th International Conference on. :299-304 Feb, 2021 |
| Relation: |
2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID) |
| Database: |
IEEE Xplore Digital Library |
