Bibliographic Details
| Title: |
Sources of variability in scaled MoS2 FETs |
| Authors: |
Smets, Quentin, Verreck, Devin, Shi, Yuanyuan, Arutchelvan, Goutham, Groven, Benjamin, Wu, Xiangyu, Sutar, Surajit, Banerjee, Sreetama, Mehta, Ankit Nalin, Lin, Dennis, Asselberghs, Inge, Radu, Iuliana |
| Source: |
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :3.1.1-3.1.4 Dec, 2020 |
| Relation: |
2020 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |
