Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology
| Title: | Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology |
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| Authors: | Tonigan, A.M., Ball, D., Vizkelethy, G., Black, J., Black, D., Trippe, J., Bielejec, E., Alles, M.L., Reed, R., Schrimpf, R.D. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(3):305-311 Mar, 2021 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2021.3056898 |
| Published in: | IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. |