Fabric defect detection using deep learning: An Improved Faster R-approach

Bibliographic Details
Title: Fabric defect detection using deep learning: An Improved Faster R-approach
Authors: An, Meng, Wang, Shiyu, Zheng, Liaomo, Liu, Xinjun
Source: 2020 International Conference on Computer Vision, Image and Deep Learning (CVIDL) CVIDL Computer Vision, Image and Deep Learning (CVIDL), 2020 International Conference on. :319-324 Jul, 2020
Relation: 2020 International Conference on Computer Vision, Image and Deep Learning (CVIDL)
Database: IEEE Xplore Digital Library