| Title: |
Reliability of Industrial grade Embedded-STT-MRAM |
| Authors: |
Ji, Y., Goo, H., Lim, J., Jeong, T. Y., Uemura, T., Kim, G. R., Seo, B. I., Lee, S., Park, G., Jo, J., Han, S. I., Lee, K., Lee, J., Hwang, S. H., Lee, D. S., Pyo, S., Jung, H. T., Han, S. H., Noh, S., Suh, K., Yoon, S. Y., Nam, H., Hwang, H., Jiang, H., Kim, J. W., Kwon, D., Song, Y. J., Koh, K. H., Rhee, H. S., Pae, S., Lee, E. |
| Source: |
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-3 Apr, 2020 |
| Relation: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |
