Bibliographic Details
| Title: |
Error catch and analysis for semiconductor memories using March tests |
| Authors: |
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-Liang Cheng, Cheng-Wen Wu |
| Source: |
IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) Computer aided design ICCAD 2000 Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on. :468-471 2000 |
| Relation: |
Proceedings of International Conference on Computer Aided Design (ICCAD) |
| Database: |
IEEE Xplore Digital Library |
