Comparative Study of High-k Dielectric on MoS2 Deposited by Plasma Enhanced ALD

Bibliographic Details
Title: Comparative Study of High-k Dielectric on MoS2 Deposited by Plasma Enhanced ALD
Authors: Chang, Wen Hsin, Okada, Naoya, Asai, Hidehiro, Fukuda, Koichi, Okada, Mitsuhiro, Endo, Takahiko, Miyata, Yasumitsu, Irisawa, Toshifumi
Source: 2019 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2019. :1-2 Jun, 2019
Relation: 2019 Silicon Nanoelectronics Workshop (SNW)
Database: IEEE Xplore Digital Library
More Details
ISBN:9784863487024
9784863487017
ISSN:21614644
DOI:10.23919/SNW.2019.8782902
Published in:2019 Silicon Nanoelectronics Workshop (SNW), Silicon Nanoelectronics Workshop (SNW), 2019