Low-Side GaN Power Device Dynamic Ron Characteristics Under Different Substrate Biases
| Title: | Low-Side GaN Power Device Dynamic Ron Characteristics Under Different Substrate Biases |
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| Authors: | Yang, Wen, Yuan, Jiann-Shiun, Krishnan, Balakrishnan, Shea, Patrick |
| Source: | 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-7 Mar, 2019 |
| Relation: | 2019 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781538695043 |
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| ISSN: | 19381891 |
| DOI: | 10.1109/IRPS.2019.8720433 |
| Published in: | 2019 IEEE International Reliability Physics Symposium (IRPS), Reliability Physics Symposium (IRPS), 2019 IEEE International |