Bibliographic Details
| Title: |
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates |
| Authors: |
Joshi, Kaustubh, Lee, Yung-Huei, Yao, Yu-Cheng, Chang, Shu-Wen, Bian, Siao-Syong, Liao, P. J., Shih, Jiaw-Ren, Chen, Min-Jan |
| Source: |
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019 |
| Relation: |
2019 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |
