On-Wafer Broadband Microwave Measurement of High Impedance Devices-CPW Test Structures with Integrated Metallic Nano-Resistances
| Title: | On-Wafer Broadband Microwave Measurement of High Impedance Devices-CPW Test Structures with Integrated Metallic Nano-Resistances |
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| Authors: | Daffe, K., Mubarak, F., Mascolo, V., Votsi, H., Ridler, N. M., Dambrine, G., Roch, I., Haddadi, K. |
| Source: | 2018 48th European Microwave Conference (EuMC) Microwave Conference (EuMC), 2018 48th European. :25-28 Sep, 2018 |
| Relation: | 2018 48th European Microwave Conference (EuMC) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9782874870514 9782874870507 |
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| DOI: | 10.23919/EuMC.2018.8541607 |
| Published in: | 2018 48th European Microwave Conference (EuMC), Microwave Conference (EuMC), 2018 48th European |