Two-Step Annealing to Remove Te Secondary-Phase Defects in CdZnTe While Preserving the High Electrical Resistivity
| Title: | Two-Step Annealing to Remove Te Secondary-Phase Defects in CdZnTe While Preserving the High Electrical Resistivity |
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| Authors: | Kim, K., Hwang, S., Yu, H., Choi, Y., Yoon, Y., Bolotnikov, A.E., James, R.B. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 65(8):2333-2337 Aug, 2018 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2018.2856805 |
| Published in: | IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. |