Effect of HCI degradation on the variability of MOSFETS
| Title: | Effect of HCI degradation on the variability of MOSFETS |
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| Authors: | Zhou, C., Jenkins, K. A., Chuang, P.I., Vezyrtzis, C. |
| Source: | 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-RT.1-1-P-RT.1-4 Mar, 2018 |
| Relation: | 2018 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |
| ISBN: | 9781538654798 |
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| ISSN: | 19381891 |
| DOI: | 10.1109/IRPS.2018.8353684 |
| Published in: | 2018 IEEE International Reliability Physics Symposium (IRPS), Reliability Physics Symposium (IRPS), 2018 IEEE International |