Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing
| Title: | Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing |
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| Authors: | Pavlidis, G., Kendig, D., Heller, E.R., Graham, S. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(5):1753-1758 May, 2018 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2018.2818621 |
| Published in: | IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices |