Bibliographic Details
| Title: |
An ultra high endurance and thermally stable selector based on TeAsGeSiSe chalcogenides compatible with BEOL IC Integration for cross-point PCM |
| Authors: |
Cheng, H. Y., Chien, W. C., Kuo, I. T., Lai, E. K., Zhu, Y., Jordan-Sweet, J. L., Ray, A., Carta, F., Lee, F. M., Tseng, P. H., Lee, M. H., Lin, Y. Y., Kim, W., Bruce, R., Yeh, C. W., Yang, C. H., BrightSky, M., Lung, H. L. |
| Source: |
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :2.2.1-2.2.4 Dec, 2017 |
| Relation: |
2017 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |
