| Title: |
Innovative submicron thermal characterization method for AlGaN/GaN power HEMTs with hyperspectral thermoreflectance imaging |
| Authors: |
Brocero, G., Kendig, D., Shakouri, A., Guhel, Y., Eudeline, Ph., Sipma, J-P, Boudart, B. |
| Source: |
2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2017 IEEE. :1-4 Oct, 2017 |
| Relation: |
2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) |
| Database: |
IEEE Xplore Digital Library |
