A SPICE-compatible model of SG-MONOS for 28nm flash macro design considering the parasitic resistance caused by trapped charges

Bibliographic Details
Title: A SPICE-compatible model of SG-MONOS for 28nm flash macro design considering the parasitic resistance caused by trapped charges
Authors: Koh, Risho, Miyamori, Mitsuru, Tsuneno, Katsumi, Muta, Tetsuya, Kawashima, Yoshiyuki
Source: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :145-148 Sep, 2017
Relation: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Database: IEEE Xplore Digital Library