A SPICE-compatible model of SG-MONOS for 28nm flash macro design considering the parasitic resistance caused by trapped charges
Title: | A SPICE-compatible model of SG-MONOS for 28nm flash macro design considering the parasitic resistance caused by trapped charges |
---|---|
Authors: | Koh, Risho, Miyamori, Mitsuru, Tsuneno, Katsumi, Muta, Tetsuya, Kawashima, Yoshiyuki |
Source: | 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on. :145-148 Sep, 2017 |
Relation: | 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) |
Database: | IEEE Xplore Digital Library |
ISBN: | 9784863486119 9784863486126 9784863486102 |
---|---|
ISSN: | 19461569 19461577 |
DOI: | 10.23919/SISPAD.2017.8085285 |
Published in: | 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2017 International Conference on |