Bibliographic Details
| Title: |
Single Event Effects in 14-Nm Intel Microprocessors |
| Authors: |
Duncan, Adam R., Szabo, Carl M., Bossev, Dobrin P., LaBel, Kenneth A., Williams, Aaron M., Gadlage, Matthew J., Ingalls, James D., Hedge, Casey H., Roach, Austin H., Kay, Matthew J. |
| Source: |
2016 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2016 IEEE. :1-9 2016 |
| Relation: |
2016 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2016) |
| Database: |
IEEE Xplore Digital Library |
