Bibliographic Details
| Title: |
Random soft error suppression by stoichiometric engineering: CMOS compatible and reliable 1Mb HfO2-ReRAM with 2 extra masks for embedded IoT systems |
| Authors: |
ChiaHua Ho, Shen, T. Y., Hsu, P. Y., Chang, S. C., Wen, S. Y., Lin, M. H, Wang, P. K., Liao, S. C., Chou, C. S., Peng, K. M., Wu, C. M., Chang, W. H., Chen, Y. H., Chen, F., Lin, L. W., Tsai, T. H., Lim, S. F., Yang, C. J., Shieh, M. H., Liao, H. H., Lin, C. H., Pai, P. L., Chan, T. Y., Chiao, Y. C. |
| Source: |
2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016 |
| Relation: |
2016 IEEE Symposium on VLSI Technology |
| Database: |
IEEE Xplore Digital Library |
