Breakdown of gate oxides during irradiation with heavy ions
| Title: | Breakdown of gate oxides during irradiation with heavy ions |
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| Authors: | Johnston, A.H., Swift, G.M., Miyahira, T., Edmonds, L.D. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 45(6):2500-2508 Dec, 1998 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
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| DOI: | 10.1109/23.736491 |
| Published in: | IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. |