Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions
| Title: | Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions |
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| Authors: | Auden, E. C., Pacheco, J. L., Bielejec, E., Vizkelethy, G., Abraham, J. B. S., Doyle, B. L. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 62(6):2919-2925 Dec, 2015 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2015.2495160 |
| Published in: | IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. |