Behavioural Biometrics Using Electricity Load Profiles

Bibliographic Details
Title: Behavioural Biometrics Using Electricity Load Profiles
Authors: Bicego, M., Recchia, F., Farinelli, A., Ramchurn, S.D., Grosso, E.
Source: 2014 22nd International Conference on Pattern Recognition Pattern Recognition (ICPR), 2014 22nd International Conference on. :1764-1769 Aug, 2014
Relation: 2014 22nd International Conference on Pattern Recognition (ICPR)
Database: IEEE Xplore Digital Library
FullText Text:
  Availability: 0
CustomLinks:
  – Url: https://login.libproxy.scu.edu/login?url=https://ieeexplore.ieee.org/document/6977021
    Name: EDS - IEEE (s8985755)
    Category: fullText
    Text: Check IEEE Xplore for full text
    MouseOverText: Check IEEE Xplore for full text. A new window will open.
  – Url: https://resolver.ebsco.com/c/xy5jbn/result?sid=EBSCO:edseee&genre=book&issn=10514651&ISBN=9781479952090&volume=&issue=&date=&spage=1764&pages=1764-1769&title=2014 22nd International Conference on Pattern Recognition, Pattern Recognition (ICPR), 2014 22nd International Conference on&atitle=Behavioural%20Biometrics%20Using%20Electricity%20Load%20Profiles&aulast=Bicego%2C%20M.&id=DOI:10.1109/ICPR.2014.310
    Name: Full Text Finder (for New FTF UI) (s8985755)
    Category: fullText
    Text: Find It @ SCU Libraries
    MouseOverText: Find It @ SCU Libraries
Header DbId: edseee
DbLabel: IEEE Xplore Digital Library
An: edseee.6977021
RelevancyScore: 975
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 974.611389160156
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Behavioural Biometrics Using Electricity Load Profiles
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Bicego%2C+M%2E%22">Bicego, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Recchia%2C+F%2E%22">Recchia, F.</searchLink><br /><searchLink fieldCode="AR" term="%22Farinelli%2C+A%2E%22">Farinelli, A.</searchLink><br /><searchLink fieldCode="AR" term="%22Ramchurn%2C+S%2ED%2E%22">Ramchurn, S.D.</searchLink><br /><searchLink fieldCode="AR" term="%22Grosso%2C+E%2E%22">Grosso, E.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: 2014 22nd International Conference on Pattern Recognition Pattern Recognition (ICPR), 2014 22nd International Conference on. :1764-1769 Aug, 2014
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: 2014 22nd International Conference on Pattern Recognition (ICPR)
PLink https://login.libproxy.scu.edu/login?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edseee&AN=edseee.6977021
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/ICPR.2014.310
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1764
    Titles:
      – TitleFull: Behavioural Biometrics Using Electricity Load Profiles
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Bicego, M.
      – PersonEntity:
          Name:
            NameFull: Recchia, F.
      – PersonEntity:
          Name:
            NameFull: Farinelli, A.
      – PersonEntity:
          Name:
            NameFull: Ramchurn, S.D.
      – PersonEntity:
          Name:
            NameFull: Grosso, E.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Type: published
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9781479952090
            – Type: issn-print
              Value: 10514651
            – Type: issn-locals
              Value: edseee.IEEEConferenc
          Titles:
            – TitleFull: 2014 22nd International Conference on Pattern Recognition, Pattern Recognition (ICPR), 2014 22nd International Conference on
              Type: main
ResultId 1