Bibliographic Details
| Title: |
Test structures for MCM-D technology characterization |
| Authors: |
Lozano, M., Santander, J., Cabruja, E., Perello, C., Ullan, M., Lora-Tamayo, E. |
| Source: |
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) Microelectronic test structures Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on. :183-188 1998 |
| Relation: |
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures |
| Database: |
IEEE Xplore Digital Library |
