A single-photon avalanche diode test chip in 150nm CMOS technology
| Title: | A single-photon avalanche diode test chip in 150nm CMOS technology |
|---|---|
| Authors: | Pancheri, Lucio, Dalla Betta, Gian-Franco, Campos Braga, Leo Huf, Xu, Hesong, Stoppa, David |
| Source: | 2014 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2014 International Conference on. :161-164 Mar, 2014 |
| Relation: | 2014 International Conference on Microelectronic Test Structures (ICMTS) |
| Database: | IEEE Xplore Digital Library |
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